Advances in Imaging and Electron Physics
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Table of contents
- Copyright Pageiv
- Contentsv
- Contributorsvii
- Prefaceix
- Future Contributionsxi
- Chapter 1. V-Vector Algebra and Volterra Filters1
- I. Introduction2
- II. Volterra Series Expansions and Volterra Filters4
- III. V-Vector Algebra12
- IV. V-Vectors for Volterra and Linear Multichannel Filters24
- V. A Novel Givens Rotation–Based Fast QR-RLS Algorithm29
- VI. Nonlinear Prediction and Coding of Speech and Audio by Using V-Vector Algebra and Volterra Filte42
- VII. Summary54
- Appendix I: The Givens Rotations55
- Appendix II: Some Efficient Factorization Algorithms56
- References59
- Chapter 2. A Brief Walk through Sampling Theory63
- I. Starting Point64
- II. Orthogonal Sampling Formulas65
- III. Classical Paley–Wiener Spaces Revisited92
- IV. Sampling Stationary Stochastic Processes124
- V. At the End of the Walk128
- References132
- Chapter 3. Kriging Filters for Space–Time Interpolation139
- I. Introduction140
- II. Data Model141
- III. Review of Kriging Methods143
- IV. Best Linear Unbiased Prediction150
- V. Cokriging Filters158
- VI. Space–Time Kriging Filters164
- VII. Applications171
- VIII. Discussion and Conclusion184
- Appendix: Optimality of Filtering Algorithms187
- References192
- Chapter 4.Constructions of Orthogonal and Biorthogonal Scaling Functions and Multiwavelets Using Fra195
- I. Introduction195
- II. Scaling Function Constructions204
- III. Associated Multiwavelets209
- IV. Wavelet Constructions218
- V. Applications to Digitized Images226
- Appendix232
- References250
- Chapter 5. Diffraction Tomography for Turbid Media253
- I. Introduction253
- II. Background259
- III. Diffraction Tomography for Turbid Media: The Forward Model268
- IV. Backpropagation in Turbid Media.281
- V. Signal-to-Noise Ratios316
- VI. Concluding Remarks338
- References339
- Chapter 6. Tree-Adapted Wavelet Shrinkage343
- I. Introduction343
- II. Comparison of Taws and Wiener Filtering345
- III. Wavelet Analysis348
- IV. Fundamentals of Wavelet-Based Denoising358
- V. Tree-Adapted Wavelet Shrinkage366
- VI. Comparison of Taws with Other Techniques383
- VII. Conclusion391
- References391
- Index395
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.