Advances in Imaging and Electron Physics
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Table of contents
- Contentsv
- Contributorsvii
- Prefaceix
- Forthcoming Contributionsxi
- Chapter 1. The Finite Volume, Finite Element, and Finite Difference Methods as Numerical Methods for1
- I. Introduction1
- II. Foundations5
- III. Representations45
- IV. Methods86
- V. Conclusions140
- References142
- Chapter 2. The Principles and Interpretations of Annular Dark-Field Z-Contrast Imaging147
- I. Introduction148
- II. Transverse Incoherence153
- III. Longitudinal Coherence170
- IV. The Ultimate Resolution and the Information Limit181
- V. Quantitative Image Processing and Analysis190
- VI. Conclusions197
- Acknowledgments199
- References200
- Chapter 3. Measurement of Magnetic Fields and Domain Structures Using a Photoemission Electron Micro205
- I. Introduction205
- II. Imaging of Ferromagnetic Domain Boundaries in a PEEM in the Operation Mode Without Restriction o206
- III. Imaging of Ferromagnetic Domain Boundaries in PEEM in the Case of Restriction of the Electron B222
- IV. Magnetic Domain Imaging in X-PEEM Using Magnetic X-Ray Circular Dichroism228
- V. Magnetic Domain Imaging in UV-PEEM Using a Kerr-Effect-Like Contrast239
- VI. Conclusions242
- Acknowledgments245
- References246
- Chapter 4. Improved Laser Scanning Fluorescence Microscopy by Multiphoton Excitation249
- I. Introduction249
- II. Future Prospects276
- References276
- Index279
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.