Advances in Imaging and Electron Physics
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Table of contents
- Contentsv
- Contributorsvii
- Prefaceix
- Forthcoming Contributionsxi
- Chapter 1. Artificial Intelligence and Pattern Recognition Techniques in Microscope Image Processing1
- I. Introduction1
- II. An overview of available tools originating from the pattern recognition and artificial intellige2
- III. Applications41
- IV. Conclusion68
- Acknowledgments70
- References70
- Chapter 2. Continuous-Time and Discrete-Time Cellular Neural Networks79
- I. Introduction81
- II. Uncoupled CNN for Processing Binary Images91
- III. Coupled CNN for Processing Binary Images132
- IV. CNN as Two-Dimensional Linear and Nonlinear Filters166
- V. CNN With Nonlinear Synaptic Laws187
- VI. Multilayer CNN and Delay-Type CNN203
- VII. Discrete-Time CNN222
- VIII. Multistage CNN Platform285
- IX. Concluding Remarks307
- X. Appendix: Index of CNN Basic Operations312
- Index325
- Color Plate Section334
Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.