Elsevier S & T

Advances in Imaging and Electron Physics

Hawkes, Peter W.

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Table of contents
  • Advances in Imaging and Electron Physics: Numerical Field Calculation for Charged Particle Opticsiii
  • Copyright Pageiv
  • Contentsv
  • Prefacexi
  • Future Contributionsxiii
  • Acknowledgmentsxvii
  • Introductionxix
  • Chapter I. Basic Field Equations1
  • 1.1 Maxwell's Equations1
  • 1.2 Electromagnetic Potentials3
  • 1.3 Variational Principles8
  • 1.4 Wave Equations and Hertz Vectors12
  • 1.5 Boundary Conditions15
  • 1.6 Integral Equations for Electrostatic Fields19
  • 1.7 Integral Equations for Magnetic Fields25
  • 1.8 Integral Equations for Wave Fields28
  • References29
  • Chapter II. Reducible Systems31
  • 2.1 Azimuthal Fourier-Series Expansions31
  • 2.2 Rotationally Symmetric Boundaries36
  • 2.3 Magnetic Round Lenses39
  • 2.4 Series Expansions45
  • 2.5 Planar Fields51
  • References57
  • Chapter III. Basic Mathematical Tools59
  • 3.1 Orthogonal Coordinate Systems59
  • 3.2 Interpolation and Numerical Differentiation74
  • 3.3 Modified Interpolation Kernels86
  • 3.4 Mathematical Representation of Curves96
  • 3.5 Mathematical Representation of Surfaces102
  • 3.6 Numerical Integration107
  • References114
  • Chapter IV. The Finite-Difference Method (FDM)115
  • 4.1 Two-Dimensional Meshes115
  • 4.2 Five-Point Configurations127
  • 4.3 Nine-Point Configurations134
  • 4.4 The Cylindrical Poisson Equation145
  • 4.5 Irregular Configurations167
  • 4.6 Subdivision of Meshes185
  • 4.7 Concluding Remarks189
  • References190
  • Chapter V. The Finite-Element Method (FEM)193
  • 5.1 Generation of Meshes193
  • 5.2 Discretization of the Variational Principle200
  • 5.3 Analysis in Triangular Elements204
  • 5.4 The Finite-Element Method in First Order216
  • 5.5 Field Interpolation229
  • 5.6 Solutions of Large Systems of Equations242
  • References259
  • Chapter VI. The Boundary Element Method263
  • 6.1 Discretization of Integral Equations264
  • 6.2 Axially Symmetric Integral Equations284
  • 6.3 Numerical Solution of Integral Equations301
  • 6.4 Special Techniques for Asymmetric Integral Equations321
  • 6.5 The Calculation of External Fields335
  • 6.6 Other Applications of Integral Equations350
  • References354
  • Chapter VII. Hybrid Methods357
  • 7.1 Combination of the FEM with the BEM357
  • 7.2 Combination of the FDM with the BEM361
  • 7.3 The Charge Simulation Method (CSM)367
  • 7.4 The Current Simulation Model387
  • 7.5 The General Alternation Method397
  • 7.6 Fast Field Calculation408
  • 7.7 Calculation of Equipotentials418
  • References426
  • Appendix429
  • Index433
Book details
  • Vendor Elsevier S & T
  • SKU 9780120147588
  • ISBN-13 9780080526218
  • Author Hawkes, Peter W.
  • Category Technology & Engineering
  • Subject Imaging Systems

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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.