Elsevier S & T

Advances in Imaging and Electron Physics

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Table of contents
  • Contentsv
  • Contributorsvii
  • Prefaceix
  • Future Contributionsxi
  • Chapter 1. Optimal and Adaptive Design of Logical Granulometric Filters1
  • I. Introduction1
  • II. Euclidean Granulometries3
  • III. Logical Granulometries6
  • IV. Adaptive Single-Parameter Disjunctive Granulometric Filters12
  • V. Adaptation in a Multiparameter Disjunctive Model24
  • VI. Granulometric Bandpass Filters39
  • VII. Logical Structural Filters56
  • References69
  • Chapter 2. Dyadic Warped Wavelets73
  • I. Introduction74
  • II. Warped Wavelets in Brief77
  • III. Multiresolution Approximation79
  • IV. From WMRA and Warped Scaling Functions to Warped QMFs90
  • V. From Warped QMF to Warped Scaling Functions and WMRA104
  • VI. Warped Wavelets118
  • VII. Construction of Iterated Warping Maps129
  • VIII. Computation of the Dyadic Warped Wavelet Transform161
  • IX. Conclusions169
  • References170
  • Chapter 3. Recent Developments in Stack Filtering and Smoothing173
  • I. Introduction174
  • II. Threshold Decomposition and Stack Smoothers175
  • III. Mirrored Threshold Decomposition and Stack Filters179
  • IV. Integer Domain Filters of Linearly Separable PBFs183
  • V. Analysis of WM Filters Using Threshold Logic189
  • VI. Recursive Weighted Median Filters and Their Nonrecursive WM Filter Synthesis195
  • VII. Weighted Median Filters with N Weights200
  • VIII. Stack Filter Optimization205
  • IX. Applications of Stack Filters223
  • X. Conclusion237
  • References238
  • Chapter 4. Resolution ReconsideredÑCon ventional Approaches and an Alternative241
  • I. Introduction242
  • II. Classical Resolution Criteria245
  • III. Other Resolution Criteria248
  • IV. Modeling and Parameter Estimation264
  • V. Elements of Singularity Theory277
  • VI. Singularity of Likelihood Functions292
  • VII. Singularity and Resolution325
  • VIII. Summary and Conclusions353
  • References355
  • Index361
Book details
  • Vendor Elsevier S & T
  • SKU 9780120147595
  • ISBN-13 9780080525457

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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.