Advances in Imaging and Electron Physics
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Table of contents
- Contentsv
- Contributorsvii
- Prefaceix
- Future Contributionsxi
- Chapter 1. Magnetic Resonance Imaging and Magnetization Transfer1
- I. Introduction2
- II. Magnetic Resonance Imaging12
- III. Development of Magnetization Transfer Theory21
- IV. Magnetization Transfer Imaging53
- V. Application in Human Studies65
- VI. Conclusions77
- Appendix I: Solution of the Complete Coupled Bloch Equations for Two-Site Chemical Exchange78
- References80
- Chapter 2. Noninterferometric Phase Determination85
- I. Introduction and Overview86
- II. Methods of Phase Imaging87
- III. A New Approach to Phase93
- IV. Propagation-Based Phase Recovery99
- V. Experimental Demonstrations108
- VI. Conclusion122
- References123
- Chapter 3. Recent Developments of Probes for Scanning Probe Microscopy129
- I. Introduction130
- II. AtomicForceMicroscopy
- III. Near-Field Optics151
- References191
- Chapter 4. Morphological Image Enhancement and Segmentation207
- I. Introduction208
- II. Some Basic Tools in Mathematical Morphology210
- III. Morphological Nonincreasing Filters Using Gradient Criteria (Morphological Slope Filters)214
- IV. A Sequential Family of MSFs229
- V. Image Segmentation using MSFs235
- VI. Nonlinear Multiscale Approach Using a Sequential Family of MSFs248
- VII. Conclusion271
- References272
- Index275
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.