Elsevier S & T

Advances in Imaging and Electron Physics

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Table of contents
  • Copyright Pageiv
  • Contentsv
  • Contributorsix
  • Prefacexi
  • Future Contributionsxiii
  • Chapter 1. A Wavelet-Based Method for Multifractal Image Analysis: From Theoretical Concepts to Expe1
  • I. Introduction2
  • II. Image Processing with the 2D Continuous Wavelet Transform7
  • III. Test Applications of the WTMM Method to Monofractal and Multifractal Rough Surfaces23
  • IV. Multifractal Analysis of High-Resolution Satellite Images of Cloud Structure41
  • V. Multifractal Analysis of 3D Turbulence Simulation Data53
  • VI. Multifractal Analysis of Digitized Mammograms73
  • VII. Conclusion80
  • References82
  • Chapter 2. An Analysis of the Geometric Distortions Produced by Median and Related Image Processing93
  • I. Introduction94
  • II. Image Filters96
  • III. Shifts Produced by Median Filters in Continuous Images105
  • IV. Shifts Produced by Median Filters in Digital Images122
  • V. Shifts Produced by Mean Filters146
  • VI. Shifts Produced by Mode Filters150
  • VII. Shifts Produced by Rank-Order Filters156
  • VIII. Rank-Order Filters„a Didactic Example170
  • IX. A Problem with Closing174
  • X. A Median-Based Corner Detector178
  • XI. Boundary Length Measurement Problem183
  • XII. Concluding Remarks188
  • References191
  • Chapter 3. Two-Photon Excitation Microscopy195
  • I. Introduction195
  • II. Historical Notes198
  • III. Basic Principles of Two-Photon Excitation of Fluorescent Molecules202
  • IV. Behavior of Fluorescent Molecules under TPE Regime212
  • V. Optical Consequences and Resolution Aspects219
  • VI. Architecture of Two-Photon Microscopy225
  • VII. Application Gallery257
  • VIII. Conclusions273
  • References276
  • Chapter 4. Phase Closure Imaging287
  • I. Introduction288
  • II. Phase Space and Integer Lattices293
  • III. Phase Closure Operator, Phase Closure Projection, and Related Properties296
  • IV. Variance–Covariance Matrix of the Closure Phases299
  • V. Spectral Phase Closure Projection299
  • VI. Reference Algebraic Framework305
  • VII. Statement of the Phase Calibration Problem307
  • VIII. Phase Calibration Discrepancy and Related Results309
  • IX. Optimal Model Phase Shift and Related Results313
  • X. Special Cases315
  • XI. Simulated Example317
  • XII. Concluding Comments319
  • Appendix 1320
  • Appendix 2321
  • Appendix 3321
  • Appendix 4323
  • References327
  • Chapter 5. Three-Dimensional Image Processing and Optical Scanning Holography329
  • I. Introduction329
  • II. Two-Pupil Optical Heterodyne Scanning330
  • III. Three-Dimensional Imaging Properties337
  • IV. Optical Scanning Holography340
  • V. Concluding Remarks347
  • References348
  • Chapter 6. Nonlinear Image Processing using Artificial Neural Networks351
  • I. Introduction352
  • II. Applications of ANNs in Image Processing356
  • III. Shared Weight Networks for Object Recognition366
  • IV. Feature Extraction in Shared Weight Networks377
  • V. Regression Networks for Image Restoration399
  • VI. Inspection and Improvement of Regression Networks418
  • VII. Conclusions442
  • References446
  • Index451
Book details
  • Vendor Elsevier S & T
  • SKU 9780120147687
  • ISBN-13 9780080490069

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Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working in this field, makes this book essential reading

*Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics

*Emphasises theory and it's application in a practical sense

*Provides the FIRST full statement of a radical new approach to 'phase calibration' and the solution of this important and difficult problem, pioneered by A, Lannes