Elsevier S & T

Advances in Imaging and Electron Physics

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Table of contents
  • Contentsv
  • Contributorsvii
  • Prefaceix
  • Future Contributionsxi
  • Chapter 1. High-Speed Electron Microscopy1
  • I. Introduction1
  • II. High-Speed Techniques2
  • III. Time-Resolving Microscopes6
  • IV. Conclusions45
  • References46
  • Chapter 2. Applications of Transmission Electron Microscopy in Mineralogy53
  • I. Introduction53
  • II. Analytical Electron Microscopy of Minerals55
  • III. Phase Separation (Exsolution)59
  • IV. HRTEM and Defect Structures81
  • V. Concluding Remark87
  • References87
  • Chapter 3. Three-Dimensional Fabrication of Miniature Electron Optics91
  • I. Introduction91
  • II. Scaling Laws for Electrostatic Lenses93
  • III. Fabrication of Miniature Electrostatic Lenses94
  • IV. Fabrication of Miniature Magnetostatic Lenses118
  • V. Electron Source119
  • VI. Detector124
  • VII. Electron-Optical Calculations126
  • VIII. Performance of a Stacked Einzel Lens132
  • IX. Summary and Future Prospects140
  • References141
  • Chapter 4. A Reference Discretization Strategy for the Numerical Solution of Physical Field Problems143
  • I. Introduction144
  • II. Foundations147
  • III. Representations183
  • IV. Methods222
  • V. Conclusions273
  • VI. Coda275
  • References276
  • Chapter 5. The Imaging Plate and Its Applications281
  • I. Introduction281
  • II. Mechanism of Photostimulated Luminescence (PSL)282
  • III. Imaging Plate (IP)288
  • IV. Elements of the IP System290
  • V. Characteristics of the IP System294
  • VI. Practical Systems302
  • VII. Applications of the IP305
  • VIII. Conclusion330
  • References330
  • Index333
Book details
  • Vendor Elsevier S & T
  • SKU 9780120147632
  • ISBN-13 9780080493244

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.