Elsevier S & T

Advances in Imaging and Electron Physics

Hawkes, Peter W.

In stock
No reviews
92.500 KD inc. VAT
License
Table of contents
  • Advances in Imaging and Electron Physicsiii
  • Copyright Pageiv
  • Contentsv
  • Contributorsix
  • Prefacexi
  • Future Contributionsxiii
  • Chapter 1. An Algebraic Approach to Subband Signal Processing1
  • I. Introduction1
  • II. An Overview of Recursive Matrices4
  • III. Recursive Operators of Filter Theory13
  • IV. More Algebraic Results22
  • V. Analysis and Synthesis Filter Banks30
  • VI. M-Channel Filter Bank Systems37
  • VII. Transmultiplexers44
  • VIII. The M-Band Lifting48
  • IX. Conclusion60
  • References61
  • Chapter 2. Determining the Locations of Chemical Species in Ordered Compounds: ALCHEMI63
  • I. Background63
  • II. Fundamentals64
  • III. ALCHEMI Results77
  • IV. Predicting Sublattice Occupancies100
  • V. Competing (or Supplementary) Techniques102
  • VI. Summary106
  • VII. Current Challenges and Future Directions (a Personal View)106
  • References107
  • Chapter 3.Aspects of Mathematical Morphology119
  • I. Introduction120
  • II. Integral Geometry: Theory122
  • III. Integral Geometry in Practice141
  • IV. Illustrative Examples149
  • V. Computer Tomography Images of Metal Foams170
  • VI. Summary176
  • Appendix A: Algorithm176
  • Appendix B: Programming Example (Fortran 90)178
  • Appendix C: Derivation of Eq. (36)182
  • Appendix D: Proof of Eq. (56)184
  • Appendix E: Proof of Eq. (57)188
  • References190
  • Chapter 4.Ultrafast Scanning Tunneling Microscopy195
  • I. Introduction195
  • II. History196
  • III. Ultrafast Scanning Probe Microscopy199
  • IV. Junction Mixing STM205
  • V. Distance Modulated STM216
  • VI. Photo-Gated STM218
  • VII. Ultrafast STM by Direct Optical Coupling to the Tunnel Junction225
  • VIII. Conclusions228
  • References228
  • Chapter 5.Low-Density Parity-Check Codes„A Statistical Physics Perspective231
  • I. Introduction232
  • II. Coding and Statistical Physics237
  • III. Sourlas Codes252
  • IV. Gallager Codes270
  • V. MacKay–Neal Codes291
  • VI. Cascading Codes318
  • VII. Conclusions and Perspectives325
  • Appendix A. Sourlas Codes: Technical Details327
  • Appendix B. Gallager Codes: Technical Details337
  • Appendix C. MN Codes: Technical Details341
  • References348
  • Chapter 6.Computer-Aided Crystallographic Analysis in the TEM355
  • I. Introduction356
  • II. Electron Diffraction and Diffraction Contrast358
  • III. A Universal Procedure for Orientation Determination from Electron Diffraction Patterns369
  • IV. Automation of Orientation Determination in TEM377
  • V. Characterization of Grain Boundaries391
  • VI. Determination of Slip Systems397
  • VII. Phase and Lattice Parameter Determination403
  • VIII. Calibration408
  • IX. Conclusions411
  • References413
  • Index417
Book details
  • Vendor Elsevier S & T
  • SKU 9780120147670
  • ISBN-13 9780080522241
  • Author Hawkes, Peter W.
  • Category Technology & Engineering
  • Subject Microelectronics

Do you have questions about this book?

Ask an expert!

Description eBook delivery & access Reviews
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.