Advances in Imaging and Electron Physics
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Table of contents
- Contentv
- Contributorsix
- Prefacexi
- Future Contributorsxiii
- Chapter 1. Fourier, Block, and Lapped Transforms1
- I. Introduction: Why Transform Signals Anyway?1
- II. Linear System Theory and Fourier Transforms3
- III. Transform Coding13
- IV. Two-Dimensional Transforms25
- V. Lapped Transforms28
- VI. Image Restoration and Enhancement39
- VII. Discussion41
- Appendix A42
- Appendix B43
- Appendix C45
- Appendix D47
- References48
- Chapter 2. On Fuzzy Spatial Distances51
- I. Introduction52
- II. Some Views on Space and Distances.54
- III. Spatial Fuzzy Distances: General Considerations63
- IV. Geodesic Distance in a Fuzzy Set75
- V. Distance from a Point to a Fuzzy Set80
- VI. Distance between Two Fuzzy Sets.85
- VII. Spatial Representations of Distance Information.104
- VIII. Qualitative Distance in a Symbolic Setting108
- IX. Conclusion114
- References115
- Chapter 3. Mathematical Morphology Applied to Circular Data123
- I. Introduction124
- II. Processing Circular Data.126
- III. Application Examples.153
- IV. 3D Polar Coordinate Color Spaces169
- V. Processing of 3D Polar Coordinate Color Spaces181
- VI. Conclusion196
- Appendix A: Connected Partitions199
- Appendix B: Cyclic Closings on Indexed Partitions199
- References.201
- Chapter 4. Quantum Tomography205
- I. Introduction206
- II. Wigner Functions and Elements of Detection Theory209
- III. General Tomographic Method222
- IV. Universal Homodyning243
- V. Multimode Homodyne Tomography.255
- VI. Applications to Quantum Measurements265
- VII. Tomography of a Quantum Device281
- VIII. Maximum Likelihood Method in Quantum Estimation287
- IX. Classical Imaging by Quantum Tomography298
- References.305
- Chapter 5. Scanning Low-Energy Electron Microscopy309
- I. Introduction310
- II. Motivations to Lower the Electron Energy.314
- III. Interaction of Slow Electrons with Solids319
- IV. Emission of Electrons.343
- V. Formation of the Primary Beam361
- VI. Detection and Specimen-Related Issues381
- VII. Instruments399
- VIII. Selected Applications413
- IX Conclusions431
- References432
- Chapter 6. Scale-Space Methods and Regularization for Denoising and Inverse Problems445
- I. Introduction446
- II. Image Smoothing and Restoration via Difiusion Filtering447
- III. Regularization of Inverse Problems460
- IV. Mumford–Shah Filtering472
- V. Regularization and Spline Approximation474
- VI. Scale-Space Methods for Inverse Problems.478
- VII. Nonconvex Regularization Models493
- VIII. Discrete BV Regularization and Tube Methods500
- IX. Wavelet Shrinkage510
- X. Regularization and Statistics517
- XI. Conclusions522
- References523
- INDEX531
- Color Plate SectionColor Plate-1
The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. Volume 128 concentrates on regularization, a vital aspect of restoration on low voltage scanning electron microscopy.
This Book looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations
The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
· Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
· Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
· Bridges the gap between academic researchers and practitioners in industry
This Book looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations
The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
· Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
· Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
· Bridges the gap between academic researchers and practitioners in industry