Advances in Imaging and Electron Physics
Regular price
92.500 KD
inc. VAT
Couldn't load pickup availability
Table of contents
- Contentsv
- Contributorsvii
- Prefaceix
- Future Contributionsxi
- Chapter 1. Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron1
- I. Introduction2
- II. Basic Principles of Statistical Experimental Design13
- III. Statistical Experimental Design of Atomic Resolution Transmission Electron Microscopy Using Sim27
- IV. Optimal Statistical Experimental Design of Conventional Transmission Electron Microscopy58
- V. Optimal Statistical Experimental Design of Scanning Transmission Electron Microscopy104
- VI. Discussion and Conclusions143
- References157
- Chapter 2. Transform-Based Image Enhancement Algorithms with Performance Measure165
- I. Introduction165
- II. Transforms with Frequency Ordered Systems170
- III. Tensor Method of Image Enhancement218
- References240
- Chapter 3. Image Registration: An Overview243
- I. Introduction243
- II. Similarity Measures246
- III. Deriving the Transformation Between the Two Images266
- IV. Feature Extraction276
- V. Literature Survey282
- VI. Conclusions287
- References288
- Index293
The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.
Several of these topics are covered in this volume, which opens with a long
chapter of monograph stature on quantitative electron microscopy at the
atomic resolution level by scientists from a well-known and very
distinguished Antwerp University Laboratory. This is unique in that the
statistical aspects are explored fully. This is followed by a contribution
by A.M. Grigoryan and S.S. Again on transform-based image enhancement,
covering both frequency-ordered systems and tensor approaches. The volume
concludes with an account of the problems of image registration and ways of
solving them by Maria Petrou of the University of Surrey; feature detection,
related image transforms and quality measures are examined separately.
The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
· Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
· Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
· Provides a comprehensive overview of international congress proceedings and associated publications, as source material.
Several of these topics are covered in this volume, which opens with a long
chapter of monograph stature on quantitative electron microscopy at the
atomic resolution level by scientists from a well-known and very
distinguished Antwerp University Laboratory. This is unique in that the
statistical aspects are explored fully. This is followed by a contribution
by A.M. Grigoryan and S.S. Again on transform-based image enhancement,
covering both frequency-ordered systems and tensor approaches. The volume
concludes with an account of the problems of image registration and ways of
solving them by Maria Petrou of the University of Surrey; feature detection,
related image transforms and quality measures are examined separately.
The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
· Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
· Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
· Provides a comprehensive overview of international congress proceedings and associated publications, as source material.