Advances in Imaging and Electron Physics
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Table of contents
- Contentsv
- Contributorsvii
- Prefaceix
- Future Contributionsxiii
- Chapter 1. On Some Iterative Concepts for Image Restoration1
- I. Introduction2
- II. Simultaneous Decomposition, Deblurring, and Denoising of Images by Means of Wavelets3
- III. Vector-Valued Regimes and Mixed Constraints21
- IV. Image Restoration with General Convex Constraints30
- V. Hybrid Wavelet-PDE Image Restoration Schemes42
- References48
- Chapter 2. Significant Advances in Scanning Electron Microscopes (1965-2007)53
- I. Introduction53
- II. Brief Review of SEM Operation55
- III. Contrast58
- IV. Improvements since 196561
- V. Tabletop SEM75
- VI. Aberration Correction75
- VII. Digital Image Processing79
- VIII. Ultrahigh Vacuum81
- IX. Future Developments81
- References83
- Chapter 3. Ptychography and Related Diffractive Imaging Methods87
- I. Introduction87
- II. Ptychography in Context88
- III. Coordinates, Nomenclature, and Scattering Approximations119
- IV. The Variants: Data, Data Processing, and Experimental Results138
- V. Conclusions178
- References180
- Chapter 4. Advances in Mathematical Morphology: Segmentation185
- I. Introduction185
- II. Criteria, Partitions, and Segmentation188
- III. Connective Segmentation191
- IV. Examples of Connective Segmentations196
- V. Partial Connections and Mixed Segmentations204
- VI. Iterated Jumps and Color Image Segmentation206
- VII. Connected Operators209
- VIII. Hierarchies and Connected Operators212
- IX. Conclusion215
- References215
- Cumulative Author Index221
- Contents of Volumes 100–149241
- Subject Index257
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as “Academic Press, 1994 (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, ‘Computer Techniques for Image Processing in Electron Microscopy’, Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing.
* Updated with contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as “Academic Press, 1994 (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, ‘Computer Techniques for Image Processing in Electron Microscopy’, Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing.
* Updated with contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians