Advances in Imaging and Electron Physics
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Table of contents
- Contentsv
- Contributorsvii
- Prefaceix
- Future Contributionsxi
- Chapter 1. Reconstruction Algorithms for Computed Tomography1
- I. Introduction2
- II. Principles of Computed Tomography4
- III. CT Reconstruction15
- IV. Outlook59
- References61
- Chapter 2. Color Spaces and Image Segmentation65
- I. Introduction66
- II. Color Spaces66
- III. Color Image Segmentation110
- IV. Relationships between Segmentation and Color Spaces140
- V. Conclusion161
- References162
- Chapter 3. Generalized Discrete Radon Transforms and Applications to Image Processing169
- I. Introduction170
- II. Background on Wavelets179
- III. Beyond Wavelets190
- IV. The Discrete p-Adic Radon Transform197
- V. Generalized Discrete Radon Transform204
- VI. Noise Removal Experiments217
- VII. Applications to Image Recognition221
- VIII. Recognition Experiments230
- IX. Conclusion231
- References235
- Chapter 4. Lie Algebraic Methods in Charged Particle Optics241
- I. Introduction242
- II. Trajectory Equations245
- III. The Field Computation251
- IV. Trajectory Equations: Solution Methods257
- V. The Analytic Perturbation Method273
- VI. The Symplectic Classification of Geometric Aberrations310
- VII. Axial Symmetric Aberrations of the Fifth Order338
- Appendix A. The Hamiltonian Transformation355
- Appendix B. The Form of the Interaction Hamiltonian for the Round Magnetic Lens357
- References360
- Chapter 5. Recent Developments in Electron Backscatter Diffraction363
- I. Introduction363
- II. Fundamental Aspects of EBSD364
- III. The Orientation Map and Data Processing374
- IV. Established Applications of EBSD380
- V. Recent Advances in EBSD382
- VI. Advances in EBSD Technology388
- VII. Trends in EBSD Usage410
- References411
- Index417
- Color Insert425
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
An important feature of these Advances is that the subjects are written in such a way that they can be understood by readers from other specialities.
An important feature of these Advances is that the subjects are written in such a way that they can be understood by readers from other specialities.