Advances in Imaging and Electron Physics
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Table of contents
- Copyright Pageiv
- Contentsv
- Contributorsvii
- Prefaceix
- Future Contributionsxi
- Chapter 1. Scanning Nonlinear Dielectric Microscopy1
- I. Introduction2
- II. Principle and Theory for SNDM3
- III. Quantitative Measurement17
- IV. Higher-Order Nonlinear Dielectric Microscopy30
- V. Three-Dimensional Measurement Technique37
- VI. Application of SNDM Technique for High-Performance Ferroelectric Material and Devices41
- VII. Conclusion54
- References55
- Chapter 2. High-Order Accurate Methods in Time-Domain Computational Electromagnetics: A Review59
- I. Introduction59
- II. Maxwell’s Equations in the Time Domain63
- III. Case for High-Order Methods in Computational Electromagnetics67
- IV. High-Order Finite Difference Schemes70
- V. Spectral Methods84
- VI. High-Order Finite Volume Schemes94
- VII. Finite Element Schemes97
- VIII. Issues in Temporal Integration113
- IX. Conclusions and Outlook115
- References117
- Chapter 3. Prefiltering for Pattern Recognition Using Wavelet Transform and Neural Networks125
- I. Introduction126
- II. Introduction to Neural Networks127
- III. Introduction to Wavelet Transform147
- IV. Pattern Recognition Using Wavelet and Neural Network for Signal and Image Processing Application158
- V. Wavelet Prefiltering Technique Applied to Handwriting Movement Analysis and Face Recognition177
- Appendix199
- References201
- Chapter 4. Electron Optics and Electron Microscopy: Conference Proceedings and Abstracts as Source M207
- I. Introduction209
- II. International Congresses (ICEM)214
- III. Regional Congresses217
- IV. National Conferences222
- V. Thematic Meetings326
- VI. Acknowledgements353
- VII. Acronyms358
- References361
- Index381
The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.
The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
· Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
· Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
· Provides a comprehensive overview of international congress proceedings and associated publications, as source material.
The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
· Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
· Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
· Provides a comprehensive overview of international congress proceedings and associated publications, as source material.