Advances in Imaging & Electron Physics
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Table of contents
- Contentsv
- Contributorsvii
- Prefaceix
- Future Contributionsxi
- Chapter 1. The Structure of Quasicrystals Studied by Atomic-Scale Observations of Transmission Elect1
- I. Introduction2
- II. Quasiperiodic Lattices3
- III. Experimental Procedures20
- IV. Electron Diffraction of Quasicrystals22
- V. High-Resolution Electron Microscopy Images of Quasicrystals31
- VI. Structure of Icosahedral Quasicrystals36
- VII. Structure of Decagonal Quasicrystals and Their Related Crystalline Phases51
- VIII. Concluding Remarks81
- References82
- Chapter 2. Add-On Lens Attachments for the Scanning Electron Microscope87
- I. Introduction87
- II. In-Lens Attachments102
- III. Single-Pole Lens Attachments125
- IV. Secondary Electron Energy Spectrometers135
- V. Multibore Objective Lenses163
- VI. Summary170
- References170
- Chapter 3. Electron Holography of Long-Range Electrostatic Fields173
- I. Introduction174
- II. Electron–Specimen Interaction177
- III. Recording and Processing of Electron Holograms196
- IV. Charged Dielectric Spheres212
- V. p–n Junctions221
- VI. Investigation of Charged Microtips235
- VII. Conclusions242
- VIII. Update243
- References245
- Chapter 4. Digital Image-Processing Technology Useful for Scanning Electron Microscopy and Its Pract251
- I. Introduction252
- II. Proper Acquisition and Handling of SEM Images253
- III. Quality Improvement of SEM Images264
- IV. Image Measurement and Analysis287
- V. SEM Parameters Measurement289
- VI. Color SEM Images303
- VII. Automatic Focusing and Astigmatism Correction312
- VIII. Remote Control of the SEM314
- IX. Ultralow Magnification and Wide-Area Observation Using the Modern Montage Technique317
- X. Active Image Processing and Multimodal Microscopy321
- References324
- Index329
- Color Plate Section337
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.