Elsevier S & T

Advances in Surface Science

De Graef, Marc

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Table of contents
  • Cover
  • Contentsv
  • Contributorsix
  • Volumes in Seriesxi
  • Prefacexv
  • Chapter 1. Surface Characterization: Composition Structure and Topography1
  • 1. Introduction1
  • 2. Ion Scattering Methods3
  • 3. Diffraction Methods27
  • 4. Electron Spectroscopy38
  • PART I. QUANTITATIVE ANALYSIS OF ELECTRON SPECTRA40
  • PART II. NANOSTRUCTURES OF SEMICONDUCTOR SYSTEMS55
  • 5. Scanning Probe Microscopy66
  • PART III. SCANNING TUNNELING MICROSCOPY66
  • PART IV. ATOMIC FORCE MICROSCOPY89
  • 6. Comparative Considerations99
  • References101
  • Chapter 2. Application of Photoelectron Spectroscopy in Inorganic and Organic Material Systems111
  • 1. Introduction111
  • 2. Fundamentals and a Brief History of ESCA112
  • 3. A Basic ESCA System113
  • 4. Information Available from ESCA114
  • 5. Binding Energy and Chemical Shift114
  • 6. Quantification127
  • 7. Application of ESCA in Oxides130
  • 8. Application of ESCA in Composite Systems141
  • 9. Key Silicate Analyses Using ESCA157
  • 10. ESCA in Selected Organic Systems167
  • 11. Conclusion183
  • References183
  • Chapter 3. Secondary Electron Fine Structure„a Method of Local Atomic Structure Characterization191
  • 1. Introduction191
  • 2. The Method of Obtaining the SEFS Experimental Data203
  • 3. Theoretical Description of the SEFS Process206
  • 4. Estimation of Amplitudes and Intensities of First- and Second-Order Processes222
  • 5. Description of the Characteristic Features of the SEFS Spectra of the Secondary Electrons236
  • 6. Analysis of the Surface Local Atomic Structure by the SEFS Method248
  • 7. Conclusion263
  • Acknowledgments265
  • References265
  • Chapter 4. Photonic and Electronic Spectroscopies for the Characterization of Organic Surfaces and O269
  • 1. Introduction269
  • 2. Diffuse Reflectance Techniques for Surface Photochemistry Studies270
  • 3. Electronic Spectroscopies280
  • 4. Examples of Systems Studied by Electronic and Photonic Spectroscopies293
  • 5. Combined Studies Involving Photonic and Electronic Spectroscopies326
  • 6. Conclusions344
  • Acknowledgments346
  • References346
  • Chapter 5. High-Pressure Surface Science355
  • 1. Introduction355
  • 2. Phase Transformations in Materials Under Static Contact Loading359
  • 3. Phase Transformations in Materials Under Dynamic Contact Loading423
  • 4. Conclusions435
  • References437
  • Index447
Book details
  • Vendor Elsevier S & T
  • SKU 9780124759855
  • ISBN-13 9780080531397
  • Author De Graef, Marc
  • Category Technology & Engineering
  • Subject Materials Science

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Surface science has a wide range of applications that include semiconductor processing, catalysis, vacuum technology, microelectronics, flat-panel displays, compact disks, televisions, computers, environmental monitoring of pollutants, biomaterials, artificial joints, soft tissues, food safety, pharmacy, and many more.

This volume is intended for upper-level undergraduate and graduate students in universities, individual research groups and researchers working on surfaces of materials. It is of interest to chemists, solid-state physists, materials scientists, surface chemists, polymer scientists, electrical engineers, chemical engineers, and everyone involved in materials science.