Handbook of Optical Constants of Solids: Volume 2
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Table of contents
- Cover
- Contentsv
- List of Contributorsxv
- PART l: DETERMINATION OF OPTICAL CONSTANTS1
- Chapter 1. Introductory Remarks3
- I. Introduction3
- II. The Chapters3
- llI. The Critiques5
- IV. The Tables6
- V. The Figures of the Tables7
- VI. General Remarks7
- VII. Errata8
- References11
- Chapter 2. Convention Confusions21
- I. Introduction21
- II. Units22
- III. Wave Equation22
- IV. Polarization26
- V. Fresnel's Amplitude Reflection Coefficients37
- VI. Nomenclature50
- VII. Concluding Remarks51
- Acknowledgments52
- References52
- Chapter 3. Methods for Determining Optical Parameters of Thin Films57
- I. Introduction57
- II. An Example of Comparison between the Different Techniques of Index Determination58
- III. Principle Methods of Index Determination60
- IV. Sensitivity and Accuracy of the Determination Methods64
- V. Overlapping and Tests of Validity of the Model67
- VI. Results and Conclusion71
- References71
- Chapter 4. The Attenuated Total Reflection Method75
- I. Introduction75
- II. Surface-Plasmon Oscillations77
- III. Optical Analysis of ATR Structures81
- IV. Guided Modes84
- V. Applications of ATR87
- VI. Conclusion94
- References94
- Chapter 5. Optical Properties of Superlattices97
- I. Introduction97
- II. The Classical Optical Response of a Multilayer System98
- III. Semiconductor Superlattices101
- IV. Amorphous Superlattices109
- V. Collective Excitations112
- VI. Lattice Disorder118
- VII. The Effect of Nonlocal Dielectric Functions120
- VIII. Concluding Remarks122
- References122
- Chapter 6. Calculation of the Refractive Index of Compound Semiconductors below the Band Gap125
- I. Introduction125
- II. The Quantum-Density-Matrix Formulation of the Complex Dielectric Constant128
- III. Comparison with Experimental Results138
- IV. Summary147
- References148
- Chapter 7. Calculation of Optical Constants, n and k, in the Interband Region151
- I. Introduction151
- II. The Extinction Coefficient, k(E), and the Refractive Index, n(E)154
- III. Discussion163
- IV. Examples166
- V. Summary174
- References175
- Chapter 8. Temperature Dependence of the Complex Index of Refraction177
- I. Introduction177
- II. Temperature Dependence of n and k179
- III. Conclusions199
- References199
- Chapter 9. Measurement of n and k in the XUV by the Angle-of-Incidence Total-External-Reflectance Me203
- I. Introduction203
- II. General Considerations204
- III. Aluminum Reflectance versus Angle in UHV206
- IV. Determination of n and k207
- V. Comparison with Other Results210
- References212
- Chapter 10. Spectroscopic Ellipsometry in the 6–35 eV Region213
- I. Introduction213
- II. The Bessy VUV Ellipsometer217
- III. Theory226
- IV. Results and Comparison with Reflectance Spectra237
- V. Summary244
- Acknowledgment245
- References245
- Chapter 11. Methods Based on Multiple-Slit Fourier Transform Interferometry for Determining Thin-Fil247
- I. Introduction to MSFTI247
- II. Fundamental Dimensional Constraints and Inequalities253
- III. Relationship of MSFTI to Alternative Metrological Techniques254
- IV. General Experimental Equations and Sensitivity Analysis258
- V. A Characterization of the Optical Constants of Au Using MSFTI in the 280–640 eV Range265
- VI. Problems and Prospects in Sample Preparation270
- VII. Prospects for MSFTI in Other Spectral Regimes272
- VIII. Summary273
- Acknowledgments274
- References274
- Chapter 12. Determination of Optical Constants from Angular-Dependent, Photoelectric-Yield Measureme279
- I. Introduction279
- II. Theoretical Background280
- III. Experimental Details285
- IV. Examples286
- V. Conclusions and Future Prospects289
- References292
- Chapter 13. Determination of Optical Constants by High-Energy, Electron-Energy-Loss Spectroscopy (EE293
- I. Introduction293
- II. Description of an EELS Experiment295
- III. Scattering Cross-Section297
- IV. Exact Determination of the Loss Function298
- V. Kramers–Kronig Analysis299
- VI. Brief Summary of the Evaluation Procedure300
- VII. Comparison with Reflectivity Measurements300
- VIII. Optical Properties of TiC, VC, TiN, and VN303
- References310
- Chapter 14. Optical Parameters for the Materials in HOC I and HOC II313
- I. Introduction313
- II. The Parameters313
- References334
- PART II: CRITIQUES337
- Subpart 1: Metals339
- An Introduction to the Data for Several Metals341
- Beryllium (Be)421
- Cobalt (Co)435
- Graphite (C)449
- References453
- Liquid Mercury (Hg)461
- References465
- Palladium (Pd)469
- References472
- Vanadium (V)477
- Subpart 2: Semiconductors487
- Aluminum Arsenide (AIAs)489
- Aluminum Antimonide (AISb)501
- Aluminum Gallium Arsenide (AlxGa1„xAs)513
- Cadmium Selenide (CdSe)559
- Cadmium Sulphide (CdS)579
- Gallium Antimonide (GaSb)597
- Silicon-Germanium Alloys (Six Ge1–x)607
- Lead Tin Telluride (PbSnTe)637
- Mercury Cadmium Telluride (Hg1–xCdxTe)655
- Selenium (Se)691
- Cubic Silicon Carbide (ß-SiC)705
- Tellurium (Te)709
- Tin Telluride (SnTe)725
- Zinc Selenide (ZnSe)737
- Zinc Telluride (ZnTe)737
- Subpart 3: Insulators759
- Aluminum Oxide (Al2O3)761
- Aluminum Oxynitride (ALON) Spinel777
- Notes Added in Proof781
- Barium Titanate (BaTiO3)789
- Beryllium Oxide (BeO)805
- Calcium Fluoride (CaF2)815
- Amorphous Hydrogenated "Diamondlike" Carbon Films and Arc-Evaporated Carbon Films837
- Cesium Iodide (CsI)853
- Copper Oxides (Cu2O, CuO)875
- Magnesium Aluminium Spinel (MgAI2O4)883
- Magnesium Fluoride (MgF2)899
- Magnesium Oxide (MgO)919
- Polyethylene (C2H4)n957
- Potassium Bromide (KBr)989
- Potassium Dihydrogen Phosphate (KH2PO4, KDP) and Three of Its Isomorphs1005
- Sodium Fluoride (NaF)1021
- Strontium Titanate (SrTiO3)1035
- Thorium Fluoride (ThF4)1049
- Water (H2O)1059
- Yttrium Oxide (Y2O3)1079
This handbook--a sequel to the widely used Handbook of Optical Constants of Solids--contains critical reviews and tabulated values of indexes of refraction (n) and extinction coefficients (k) for almost 50 materials that were not covered in the original handbook. For each material, the best known n and k values have been carefully tabulated, from the x-ray to millimeter-wave region of the spectrum by expert optical scientists. In addition, the handbook features thirteen introductory chapters that discuss the determination of n and k by various techniques.
* Contributors have decided the best values for n and k
* References in each critique allow the reader to go back to the original data to examine and understand where the values have come from
* Allows the reader to determine if any data in a spectral region needs to be filled in
* Gives a wide and detailed view of experimental techniques for measuring the optical constants n and k
* Incorporates and describes crystal structure, space-group symmetry, unit-cell dimensions, number of optic and acoustic modes, frequencies of optic modes, the irreducible representation, band gap, plasma frequency, and static dielectric constant
* Contributors have decided the best values for n and k
* References in each critique allow the reader to go back to the original data to examine and understand where the values have come from
* Allows the reader to determine if any data in a spectral region needs to be filled in
* Gives a wide and detailed view of experimental techniques for measuring the optical constants n and k
* Incorporates and describes crystal structure, space-group symmetry, unit-cell dimensions, number of optic and acoustic modes, frequencies of optic modes, the irreducible representation, band gap, plasma frequency, and static dielectric constant