Elsevier S & T

Physics and Engineering of Radiation Detection

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Table of contents

Cover
Contentsvii
Prefacexxii
Chapter 1 Properties and Sources of Radiation1
1.1 Types of Radiation1
1.2 Waves or Particles?2
1.3 Radioactivity and Radioactive Decay4
1.3.A: Decay Energy or Q-Value9
1.3.B: The Decay Equation11
1.3.C: Composite Radionuclides15
1.3.D: Radioactive Chain18
1.3.E: Decay Equilibrium22
1.3.F: Branching Ratio24
1.3.G: Units of Radioactivity25
1.4 Activation26
1.5 Sources of Radiation27
1.5.A: Natural Sources27
1.5.B: Man-Made Sources29
1.6 General Properties and Sources of Particles and Waves30
1.6.A: Photons31
1.6.B: Electrons41
1.6.C: Positrons45
1.6.D: Protons46
1.6.E: Neutrons48
1.6.F: Alpha Particles53
1.6.G: Fission Fragments54
1.6.H: Muons, Neutrinos and other Particles56
Chapter 2 Interaction of Radiation with Matter65
2.1 Some Basic Concepts and Terminologies65
2.1.A: Inverse Square Law66
2.1.B: Cross Section67
2.1.C: Mean Free Path68
2.1.D: Radiation Length70
2.1.E: Conservation Laws74
2.2 Types of Particle Interactions76
2.2.A: Elastic Scattering77
2.2.B: Inelastic Scattering77
2.2.C: Annihilation77
2.2.D: Bremsstrahlung79
2.2.E: Cherenkov Radiation80
2.3 Interaction of Photons with Matter82
2.3.A: Interaction Mechanisms82
2.3.B: Passage of Photons through Matter97
2.4 Interaction of Heavy Charged Particles with Matter105
2.4.A: Rutherford Scattering105
2.4.B: Passage of Charged Particles through Matter110
2.4.C: Bragg Curve116
2.4.D: Energy Straggling117
2.4.E: Range and Range Straggling118
2.5 Interaction of Electrons with Matter122
2.5.A: Interaction Modes122
2.5.B: Passage of Electrons through Matter127
2.5.C: Energy Straggling130
2.5.D: Range of Electrons132
2.6 Interaction of Neutral Particles with Matter137
2.6.A: Neutrons137
2.7 Problems143
Chapter 3 Gas Filled Detectors149
3.1 Production of Electron-Ion Pairs149
3.2 Diffusion and Drift of Charges in Gases152
3.2.A: Diffusion in the Absence of Electric Field152
3.2.B: Drift of Charges in Electric Field153
3.2.C: Effects of Impurities on Charge Transport157
3.3 Regions of Operation of Gas Filled Detectors161
3.3.A: Recombination Region161
3.3.B: Ion Chamber Region161
3.3.C: Proportional Region162
3.3.D: Region of Limited Proportionality166
3.3.E: Geiger-Mueller Region166
3.3.F: Continuous Discharge169
3.4 Ionization Chambers169
3.4.A: Current Voltage Characteristics170
3.4.B: Mechanical Design170
3.4.C: Choice of Gas177
3.4.D: Special Types of Ion Chambers178
3.4.E: Applications of Ion Chambers181
3.4.F: Advantages and Disadvantages of Ion Chambers181
3.5 Proportional Counters182
3.5.A: Multiplication Factor184
3.5.B: Choice of Gas188
3.5.C: Special Types of Proportional Counters190
3.6 Geiger-Mueller Counters191
3.6.A: Current-Voltage Characteristics193
3.6.B: Dead Time194
3.6.C: Choice of Gas196
3.6.D: Quenching197
3.6.E: Advantages and Disadvantages of GM Counters198
3.7 Sources of Error in Gaseous Detectors198
3.7.A: Recombination Losses198
3.7.B: Effects of Contaminants200
3.7.C: Effects of Space Charge Buildup202
3.8 Detector Efficiency207
3.8.A: Signal-to-Noise Ratio212
Chapter 4 Liquid Filled Detectors221
4.1 Properties of Liquids221
4.1.A: Charge Pair Generation and Recombination221
4.1.B: Drift of Charges226
4.2 Liquid Ionization Chamber229
4.2.A: Applications of Liquid Filled Ion Chambers230
4.3 Liquid Proportional Counters230
4.3.A: Charge Multiplication230
4.4 Commonly Used Liquid Detection Media233
4.5 Sources of Error in Liquid Filled Ionizing Detectors234
4.5.A: Recombination234
4.5.B: Parasitic Electron Capture and Trapping236
4.6 Cherenkov Detectors240
4.7 Bubble Chamber242
4.8 Liquid Scintillator Detectors243
Chapter 5 Solid State Detectors249
5.1 Semiconductor Detectors249
5.1.A: Structure of Semiconductors250
5.1.B: Charge Carriers Distribution251
5.1.C: Intrinsic, Compensated, and Extrinsic Semiconductors251
5.1.D: Doping252
5.1.E: Mechanism and Statistics of Electron-Hole Pair Production255
5.1.F: Charge Conductivity264
5.1.G: Materials Suitable for Radiation Detection266
5.1.H: The pn-Junction284
5.1.I: Modes of Operation of a pn-Diode294
5.1.J: Desirable Properties297
5.1.K: Specific Semiconductor Detectors298
5.1.L: Radiation Damage in Semiconductors302
5.2 Diamond Detectors306
5.2.A: Charge Pair Production307
5.2.B: Recombination307
5.2.C: Drift of Charge Pairs308
5.2.D: Leakage Current310
5.2.E: Detector Design310
5.2.F: Radiation Hardness311
5.2.G: Applications312
5.3 Thermoluminescent Detectors312
5.3.A: Principle of Thermoluminescence313
Chapter 6 Scintillation Detectors and Photodetectors319
6.1 Scintillation Mechanism and Scintillator Properties320
6.1.A: Basic Scintillation Mechanism320
6.1.B: Light Yield322
6.1.C: Rise and Decay Times325
6.1.D: Quenching327
6.1.E: Density and Atomic Weight328
6.1.F: Mechanical Properties and Stability328
6.1.G: Optical Properties328
6.1.H: Phosphorescence or Afterglow329
6.1.I: Temperature Dependence330
6.1.J: Radiation Damage332
6.1.K: Scintillation Efficiency333
6.2 Organic Scintillators336
6.2.A: Scintillation Mechanism336
6.2.B: Plastic Scintillators339
6.2.C: Liquid Scintillators345
6.2.D: Crystalline Scintillators348
6.3 Inorganic Scintillators350
6.3.A: Scintillation Mechanism351
6.3.B: Radiation Damage352
6.3.C: Some Common Inorganic Scintillators353
6.4 Transfer of Scintillation Photons360
6.4.A: Types of Light Guides361
6.5 Photodetectors366
6.5.A: Photomultiplier Tubes367
6.5.B: Photodiode Detectors403
6.5.C: Avalanche Photodiode Detectors (APD)405
Chapter 7 Position Sensitive Detection and Imaging423
7.1 Some Important Terminologies and Quantities423
7.1.A: Spatial Resolution423
7.1.B: Efficiency437
7.1.C: Sensitivity439
7.1.D: Dynamic Range439
7.1.E: Uniformity439
7.1.F: Temporal Linearity440
7.1.G: Noise and Signal-to-Noise Ratio (S/N)440
7.2 Position Sensitive Detection441
7.2.A: Types of Position Sensitive Detectors441
7.2.B: Multiwire Proportional Chambers (MWPCs)441
7.2.C: Multiwire Drift Chamber445
7.2.D: Microstrip Gas Chambers445
7.2.E: Semiconductor Microstrip Detectors (SMSDs)446
7.3 Imaging Devices450
7.3.A: Conventional Imaging450
7.3.B: Electronics Imaging451
7.3.C: Charged Coupled Devices452
7.3.D: Direct Imaging452
7.3.E: Indirect Imaging456
7.3.F: Microstrip and Multiwire Detectors457
7.3.G: Scintillating Fiber Detectors457
Chapter 8 Signal Processing463
8.1 Preamplification464
8.1.A: Voltage Sensitive Preamplifier465
8.1.B: Current Sensitive Preamplifier467
8.1.C: Charge Sensitive Preamplifier468
8.2 Signal Transport474
8.2.A: Type of Cable476
8.3 Pulse Shaping480
8.3.A: Delay Line Pulse Shaping480
8.3.B: CR-RC Pulse Shaping481
8.3.C: Semi-Gaussian Pulse Shaping488
8.3.D: Semi-Triangular Pulse Shaping489
8.4 Filtering490
8.4.A: Low Pass Filter491
8.4.B: High Pass Filter493
8.4.C: Band Pass Filter493
8.5 Amplification493
8.6 Discrimination494
8.6.A: Pulse Counting495
8.7 Analog to Digital Conversion498
8.7.A: A/D-Conversion Related Parameters498
8.7.B: A/D Conversion Methods500
8.7.C: Hybrid ADCs506
8.8 Digital Signal Processing506
8.8.A: Digital Filters508
8.9 Electronics Noise509
8.9.A: Types of Electronics Noise511
8.9.B: Noise in Specific Components516
8.9.C: Measuring System Noise519
8.9.D: Noise Reduction Techniques519
Chapter 9 Essential Statistics for Data Analysis525
9.1 Measures of Centrality526
9.2 Measure of Dispersion528
9.3 Probability528
9.3.A: Frequentist Approach529
9.3.B: Bayesian Approach529
9.3.C: Probability Density Function529
9.3.D: Some Common Distribution Functions536
9.4 Confidence Intervals546
9.5 Measurement Uncertainty548
9.5.A: Systematic Errors548
9.5.B: Random Errors549
9.5.C: Error Propagation549
9.5.D: Presentation of Results551
9.6 Confidence Tests551
9.6.A: Chi-Square (χsup[2]) Test552
9.6.B: Student's t Test553
9.7 Regression555
9.7.A: Simple Linear Regression555
9.7.B: Nonlinear Regression556
9.8 Correlation558
9.8.A: Pearson r or Simple Linear Correlation559
9.9 Time Series Analysis561
9.9.A: Smoothing562
9.10 Frequency Domain Analysis563
9.11 Counting Statistics565
9.11.A: Measurement Precision and Detection Limits565
Chapter 10 Software for Data Analysis575
10.1 Standard Analysis Packages575
10.1.A: ROOT575
10.1.B: Origin®586
10.1.C: MATLAB®591
10.2 Custom-Made Data Analysis Packages597
10.2.A: Data Import/Export Routines598
10.2.B: Data Analysis Routines599
10.2.C: Code Generation600
10.2.D: Result Display600
Chapter 11 Dosimetry and Radiation Protection603
11.1 Importance of Dosimetry603
11.1.A Dose and Dose Rate604
11.2 Quantities Related to Dosimetry604
11.2.A: Radiation Exposure and Dose604
11.2.B: Flux or Fluence Rate609
11.2.C: Integrated Flux or Fluence610
11.2.D: Exposure and Absorbed Dose - Mathematical Definitions611
11.2.E: Kerma, Cema, and Terma615
11.2.F: Measuring Kerma and Exposure619
11.2.G: Cavity Theories619
11.2.H: LET and RBE622
11.2.I: Beam Size623
11.2.J: Internal Dose624
11.3 Passive Dosimetry627
11.3.A: Thermoluminescent Dosimetry627
11.3.B: Optically Stimulated Luminescence Dosimetry631
11.3.C: Film Dosimetry633
11.3.D: Track Etch Dosimetry635
11.4 Active Dosimetry636
11.4.A: Ion Chamber Dosimetry636
11.4.B: Solid State Dosimetry642
11.4.C: Plastic Scintillator Dosimeter646
11.4.D: Quartz Fiber Electroscope647
11.5 Microdosimetry649
11.5.A: Microdosimetric Quantities649
11.5.B: Experimental Techniques651
11.6 Biological Effects of Radiation656
11.6.A: Acute and Chronic Radiation Exposure657
11.6.B: Effects and Symptoms of Exposure660
11.6.C: Exposure Limits660
11.7 Radiation Protection662
11.7.A: Exposure Reduction662
Chapter 12 Radiation Spectroscopy673
12.1 Spectroscopy of Photons673
12.1.A: γ-Ray Spectroscopy673
12.1.B: Calibration677
12.1.C: X-ray Spectroscopy678
12.2 Spectroscopy of Charged Particles692
12.2.A: α-Particle Spectroscopy692
12.2.B: Electron Spectroscopy698
12.3 Neutron Spectroscopy699
12.3.A: Neutrons as Matter Probes699
12.3.B: Neutron Spectrometry Techniques701
12.4 Mass Spectroscopy710
12.5 Time Spectroscopy711
Chapter 13 Data Acquisition Systems717
13.1 Data Acquisition Chain717
13.1.A: Pulse Counting717
13.1.B: Energy Spectroscopy719
13.1.C: Time Spectroscopy719
13.1.D: Coincidence Spectroscopy720
13.2 Modular Instruments721
13.2.A: NIM Standard721
13.2.B: CAMAC Standard725
13.2.C: VME Standard726
13.2.D: FASTBUS Standard729
13.3 PC Based Systems729
13.3.A: PCI Boards729
13.3.B: PC Serial Port Modules730
13.3.C: PC Parallel Port Modules732
13.3.D: USB Based Modules732
13.3.E: TCP/IP Based Systems732
Appendices737
A: Essential Electronic Measuring Devices739
A.1 Multimeters739
A.2 Oscilloscope741
B: Constants and Conversion Factors749
B.1 Constants749
B.2 Masses and Electrical Charges of Particles750
B.3 Conversion Prefixes751
C: VME Connector Pin Assignments753
Index757
A757
B757
C757
D758
E758
F759
G759
H759
I759
J760
K760
L760
M760
N760
O760
P760
Q761
R761
S762
T763
U763
V763
W764
X764

Book details

Vendor Elsevier S & T
SKU 9780120455812
ISBN-13 9780080569642

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This book presents an overview of the physics of radiation detection and its applications. It covers the origins and properties of different kinds of ionizing radiation, their detection and measurement, and the procedures used to protect people and the environment from their potentially harmful effects. It details the experimental techniques and instrumentation used in different detection systems in a very practical way without sacrificing the physics content. It provides useful formulae and explains methodologies to solve problems related to radiation measurements. With abundance of worked-out examples and end-of-chapter problems, this book enables the reader to understand the underlying physical principles and their applications. Detailed discussions on different detection media, such as gases, liquids, liquefied gases, semiconductors, and scintillators make this book an excellent source of information for students as well as professionals working in related fields. Chapters on statistics, data analysis techniques, software for data analysis, and data acquisition systems provide the reader with necessary skills to design and build practical systems and perform data analysis.

* Covers the modern techniques involved in detection and measurement of radiation and the underlying physical principles
* Illustrates theoretical and practical details with an abundance of practical, worked-out examples
* Provides practice problems at the end of each chapter

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