Elsevier S & T

Practical Guide to Surface Science and Spectroscopy

Chung, Yip-Wah

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Table of contents
  • Contentsv
  • Prefacexi
  • Chapter 1. Fundamental Concepts in Ultrahigh Vacuum, Surface Preparation, and Electron Spectroscopy1
  • 1.1 Introduction1
  • 1.2 The Need for Ultrahigh Vacuum2
  • 1.3 Achieving Ultrahigh Vacuum4
  • 1.4 Pressure Measurement7
  • 1.5 Preparation of Clean Surfaces9
  • 1.6 Need for Electron Spectroscopy10
  • 1.7 Electron Scattering from Solid Surfaces12
  • 1.8 Electron Energy Analyzers13
  • 1.9 Other Considerations19
  • Problems19
  • Chapter 2. Auger Electron Spectroscopy23
  • 2.1 Auger Electron Emission23
  • 2.2 Experimental Aspects24
  • 2.3 Sensitivity of Auger Electron Spectroscopy26
  • 2.4 Energies and Shapes of Auger Peaks27
  • 2.5 Chemical State Effects28
  • 2.6 Intensity of Auger Electron Emission29
  • 2.7 Profile Analysis33
  • 2.8 Scanning Auger Microprobe33
  • 2.9 Quantitative Analysis35
  • 2.10 Case Study: Surface Composition of a 5 at% Al–Fe Alloy39
  • Problems40
  • Chapter 3. Photoelectron Spectroscopy45
  • 3.1 One-Electron Description of the Photoelectric Effect45
  • 3.2 Photon Sources47
  • 3.3 Detectors50
  • 3.4 Element Identification51
  • 3.5 Chemical Shift51
  • 3.6 Relaxation Shift and Multiplet Splitting53
  • 3.7 Chemical Bonding on Surfaces54
  • 3.8 Band Structure Studies56
  • 3.9 Extended X-Ray Absorption Fine Structure60
  • 3.10 Special Applications62
  • Problems64
  • Chapter 4. Inelastic Scattering of Electrons and Ions69
  • 4.1 One-Electron Excitation of Core and Valence Electrons69
  • 4.2 Plasmon Excitations71
  • 4.3 Surface Vibrations72
  • 4.4 Ion Scattering Spectroscopy75
  • 4.5 Secondary Ion Mass Spectrometry77
  • Problems80
  • Chapter 5. Low-Energy Electron Diffraction83
  • 5.1 Introduction83
  • 5.2 Electron Diffraction83
  • 5.3 Naming Conventions for Surface Structures85
  • 5.4 Experimental Aspects87
  • 5.5 Selected Properties of the Surface Reciprocal Space88
  • 5.6 Kinematic Theory89
  • 5.7 Applications of the Kinematic Theory92
  • Problems97
  • Appendix Diffraction Intensity as a Function of Temperature98
  • Chapter 6. Scanning Probe Microscopy101
  • 6.1 Introduction101
  • 6.2 Historical Perspective102
  • 6.3 Review of Electron Tunneling103
  • 6.4 Principle of STM Imaging104
  • 6.5 STM Image Interpretation106
  • 6.6 STM Implementation107
  • 6.7 Applications of STM112
  • 6.8 Limitations of STM and Solutions114
  • 6.9 Scanning Capacitance Microscopy115
  • 6.10 Atomic Force Microscopy115
  • Problems116
  • Additional Reading117
  • Chapter 7. Interfacial Segregation119
  • 7.1 Introduction119
  • 7.2 Gibbs Adsorption Equation119
  • 7.3 One Component Systems123
  • 7.4 Surface Segregation in Binary Alloys124
  • 7.5 Relationship Between Surface and Bulk Composition of Binary Alloys127
  • 7.6 The Unified Segregation Model129
  • 7.7 Environmental Effects on Surface Segregation131
  • Problems133
  • Chapter 8. Metal–Semiconductor Interfaces137
  • 8.1 Surface States137
  • 8.2 Semiconductor Surfaces141
  • 8.3 Work Function Measurements146
  • 8.4 The Metal–Semiconductor Interface148
  • Problems153
  • Appendix Useful Information for Semiconductors156
  • Chapter 9. Gas–Surface Interactions157
  • 9.1 Introduction157
  • 9.2 Heat of Adsorption159
  • 9.3 The Langmuir Adsorption Isotherm167
  • 9.4 Pressure Effects172
  • 9.5 Promoters, Poisons, and Ensemble Effects172
  • 9.6 Surface Compounds173
  • 9.7 Case Studies174
  • Problems178
  • Index181
Book details
  • Vendor Elsevier S & T
  • SKU 9780121746100
  • ISBN-13 9780080497785
  • Author Chung, Yip-Wah
  • Category Science
  • Subject Physical & Theoretical

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Practical Guide to Surface Science and Spectroscopy provides a practical introduction to surface science as well as describes the basic analytical techniques that researchers use to understand what occurs at the surfaces of materials and at their interfaces. These techniques include auger electron spectroscopy, photoelectron spectroscopy, inelastic scattering of electrons and ions, low energy electron diffraction, scanning probe microscopy, and interfacial segregation. Understanding the behavior of materials at their surfaces is essential for materials scientists and engineers as they design and fabricate microelectronics and semiconductor devices.


The book gives over 100 examples, discussion questions and problems with varying levels of difficulty. Included with this book is a CD-ROM, which not only contains the same information, but also provides many elements of animation and interaction that are not easily emulated on paper. In diverse subject matters ranging from the operation of ion pumps, computer-assisted data acquisition to tapping mode atomic force microscopy, the interactive component is especially helpful in conveying difficult concepts and retention of important information. The succinct style and organization of this practical guide is ideal for anyone who wants to get up to speed on a given topic in surface spectroscopy or phenomenon within a reasonable amount of time.

Key Features
* Both theory and practice are emphasized
* Logical organization allows one to get up to speed on any given topic quickly
* Numerous examples, questions for discussion and practice problems are included
* The CD includes animation and interactive elements that help to convey difficult concepts