Silicon-Germanium Strained Layers and Heterostructures: Semi-conductor and semi-metals series

Willander, M.; Jain, Suresh C.

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Table of contents
  • Cover
  • Contentsv
  • Preface to the first editionxi
  • Preface to the second editionxiii
  • Chapter 1. Introduction1
  • 1.1 Development of SiGe technology1
  • 1.2 Commercial production of SiGe devices3
  • 1.3 Landmarks in the development of SiGe devices5
  • Chapter 2. Strain, stability, reliability and growth9
  • 2.1 Strain and dislocations9
  • 2.2 Strain and dislocation energies12
  • 2.3 Critical thickness17
  • 2.4 Stability of strained layers22
  • 2.5 Stresses in quantum structures29
  • 2.6 Poly-SiGe and poly-SiGeC films33
  • 2.7 Growth of strain relaxed layers35
  • Chapter 3. Mechanism of strain relaxation41
  • 3.1 Introduction41
  • 3.2 Propagation of dislocations41
  • 3.3 Nucleation, multiplication and blocking47
  • 3.4 Strain relaxation54
  • 3.5 Summary58
  • Chapter 4. Strain, growth, and TED in SiGeC layers61
  • 4.1 Introduction61
  • 4.2 Strain and Growth of Si1–x–yGexCy layers62
  • 4.3 Thermal diffusion73
  • 4.4 TED and its suppression by carbon79
  • 4.5 Modelling of TED in Si1–x–yGexCy layers84
  • 4.6 Conclusion and summary90
  • Chapter 5. Bandstructure and related properties91
  • 5.1 Effect of strain on bandstructure91
  • 5.2 Effective Density of States and Fermi energy98
  • 5.3 Bandgap narrowing due to heavy doping101
  • 5.4 Mobility105
  • 5.5 Electrical properties of SiGeC films116
  • 5.6 Optical properties of unstrained alloys118
  • 5.7 Optical studies of strained layers124
  • 5.8 Optical studies of quantum wires and dots134
  • 5.9 Superlattices (SLs)140
  • Chapter 6. Heterostructure Bipolar Transistors147
  • 6.1 Introduction147
  • 6.2 Design149
  • 6.3 Technology154
  • 6.4 DC performance of SiGe HBTs161
  • 6.5 AC characteristics of the HBTs165
  • 6.6 Optimization of BVceo, ft and fmax169
  • 6.7 HBTs with SiGeC base-layers178
  • 6.8 Noise183
  • 6.9 Circuit applications188
  • 6.10 Summary192
  • Chapter 7. FETs and other devices195
  • 7.1 Ge channel MOS transistors195
  • 7.2 Strained layer p-channel MOSFETs196
  • 7.3 Strained layer n-channel MOSFETs202
  • 7.4 Modulation doped Field Effect Transistors206
  • 7.5 Strained-layer MOSFETs on insulator212
  • 7.6 High-k gate-insulators215
  • 7.7 MOSFETs containing Si1-x-yGexCy alloys218
  • 7.8 Ultra-shallow junctions219
  • 7.9 Application of SiGe to ultrashallow junctions226
  • 7.10 Resonant tunnelling diodes231
  • 7.11 Photodetectors, waveguide switch and laser236
  • Bibliography243
  • Index281
  • Contents of Volumes287
Book details
  • Vendor Elsevier S & T
  • SKU 9780127521831
  • ISBN-13 9780080541020
  • Author Willander, M.; Jain, Suresh C.
  • Edition 2nd
  • Category Technology & Engineering
  • Subject Materials Science

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Ask an expert!

The study of Silicone Germanium strained layers has broad implications for material scientists and engineers, in particular those working on the design and modelling of semi-conductor devices.

Since the publication of the original volume in 1994, there has been a steady flow of new ideas, new understanding, new Silicon-Germanium (SiGe) structures and new devices with enhanced performance. Written for both students and senior researchers, the 2nd edition of Silicon-Germanium Strained Layers and Heterostructures provides an essential up-date of this important topic, describing in particular the recent developments in technology and modelling.

* Fully-revised and updated 2nd edition incorporating important recent breakthroughs and a complete literature review
* The extensive bibliography of over 400 papers provides a comprehensive and coherent overview of the subject
* Appropriate for students and senior researchers