Elsevier S & T

Specular Gloss

Silvennoinen, Raimo; Peiponen, Kai-Erik; Myller, Kari

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Table of contents
  • Table of Contentsv
  • Prefacexi
  • Notationxiii
  • Video Clip Examples of Gloss in Different Applicationsxix
  • Disclaimerxxi
  • Chapter 1 Introduction1
  • Chapter 2 Light Reflection from Ideal Surface5
  • 2.1. Electromagnetic theory of light waves6
  • 2.1.1. Wave equation6
  • 2.1.2. Maxwell equations for free space8
  • 2.2. Light irradiance13
  • 2.3. Light polarization14
  • 2.4. Real refractive index16
  • 2.5. Group velocity19
  • 2.6. Normal reflection of light21
  • 2.7. Light reflection at an oblique angle of incidence25
  • 2.8. Complex refractive index31
  • 2.9. Beer–Lambert law39
  • 2.10. Oblique angle reflection from light-absorbing isotropic media40
  • 2.11. Reflectance from anisotropic media44
  • 2.12. Specular reflection from nanostructured medium46
  • Chapter 3 Light Reflection from a Rough Surface53
  • 3.1. Statistical surface roughness parameters54
  • 3.2. Light diffraction from finishing marks58
  • 3.3. Kubelka–Munk function for diffuse reflection63
  • 3.4. Specular reflection of laser beam from moderately rough surface66
  • 3.5. Specular reflection from surface with normal distribution of surface heights69
  • 3.6. Speckle pattern71
  • 3.7. Statistical parameters for specular gloss75
  • Chapter 4 Specular Gloss79
  • 4.1. Visual appearance of a surface79
  • 4.2. Directionality of surface85
  • 4.3. Standardized method for specular gloss87
  • 4.4. Problems in the gloss measurement95
  • Chapter 5 Light Sources for Gloss Measurement103
  • 5.1. Radiation laws103
  • 5.1.1. Geometrical consideration104
  • 5.1.2. Kirchhoff’s law108
  • 5.1.3. Black body radiation109
  • 5.1.4. Grey body radiation112
  • 5.1.5. Stefan–Boltzmann law113
  • 5.1.6. Wien’s displacement law114
  • 5.1.7. Planck’s radiation law116
  • 5.1.7.1. Derivation of Stefan–Boltzmann constant (σ)118
  • 5.1.7.2. Derivation of constant (C0) in Wien’s displacement law119
  • 5.1.8. Brightness temperature120
  • 5.1.9. Colour temperature123
  • 5.2. White light source (So) for standardized glossmeter127
  • 5.2.1. Brightness and emissivity of tungsten127
  • 5.2.2. Stability of tungsten as an So130
  • 5.2.3. Spectral irradiance of incandescent lamp of standardized glossmeter133
  • 5.3. Coherence and partial coherence of light136
  • 5.3.1. Damping effect on function of electric dipole138
  • 5.3.1.1. Light emission influenced by damping143
  • 5.3.1.2. Light absorption influenced by damping146
  • 5.3.2. Concept of coherence149
  • 5.3.2.1. Time coherence150
  • 5.3.2.2. Spatial coherence152
  • 5.3.3. Coherence function and fringe visibility155
  • 5.3.4. Coherence of thermal So160
  • 5.3.5. Photon correlation166
  • 5.4. Light-emitting diode168
  • 5.4.1. Energy bands in semiconductors169
  • 5.4.2. Radiative and non-radiative transitions173
  • 5.4.3. Spectral broadening of luminescence spectra177
  • 5.4.4. Light generation efficiency179
  • 5.4.5. Electrical characteristics of LEDs182
  • 5.4.6. Architecture of LED184
  • 5.4.7. Frequency response of LED186
  • 5.4.8. Spectral response of LED187
  • 5.5. Laser190
  • 5.5.1. Theory of inversion population – a paradox of equilibrium190
  • 5.5.2. Lasing conditions193
  • 5.5.3. Spectral profile of lasing radiation197
  • 5.5.4. Laser beam directionality199
  • 5.5.5. Cavity modes200
  • 5.5.5.1. Longitudinal modes200
  • 5.5.5.2. Transverse modes201
  • 5.5.6. Electrical characteristics of semiconductor LD207
  • 5.5.7. Laser categories209
  • Appendix A.5.1210
  • Appendix A.5.2211
  • Appendix A.5.3213
  • Appendix A.5.4214
  • Appendix A.5.5215
  • Chapter 6 Detectors for Gloss Measurement219
  • 6.1. Principle to simulate human eye response in detectors220
  • 6.1.1. Basic structure of human eye220
  • 6.1.2. Optical properties of human eye227
  • 6.1.3. Hazards in human eye after excess of MPE229
  • 6.1.4. Standardized human eye230
  • 6.2. Semiconductor photodiode231
  • 6.2.1. Photovoltaic effect231
  • 6.2.2. Spectral response of PD237
  • 6.2.3. Electric response of PD239
  • 6.3. APD241
  • 6.4. Phototransistor242
  • 6.5. Photoarray243
  • 6.5.1. Basic principle of CTD244
  • 6.5.1.1. Principle of BBD247
  • 6.5.1.2. Principle of SCCD248
  • 6.5.1.3. Principle of BCCD249
  • 6.5.1.4. Principle of PCCD and P2CCD249
  • 6.5.2. Charge-coupled photoarray251
  • 6.5.2.1. One-dimensional CCD array251
  • 6.5.2.2. Two-dimensional CCD array252
  • 6.5.2.3. Colour CCD array254
  • 6.6. Electric noise255
  • 6.6.1. Types of basic electric noise255
  • 6.6.2. Signal to noise ratio, noise figure and noise temperature263
  • 6.6.3. Noise in real materials and in electric components265
  • 6.6.4. Detecting limits of photodetectors265
  • Chapter 7 Traditional Glossmeters267
  • 7.1. Spectral reflectance267
  • 7.1.1. Non-coherent spectral reflectance269
  • 7.1.2. Coherent spectral reflectance274
  • 7.2. Principle of reflectometer275
  • 7.2.1. Principle of spectral reflectometer276
  • 7.2.1.1. Monochromator276
  • 7.2.1.2. Specular reflectometer281
  • 7.2.1.3. Reflectometer for specular and diffuse radiation284
  • 7.2.2. Principle of laser reflectometer286
  • 7.2.3. Spectral ellipsometer290
  • 7.3. Spectrophotometer295
  • 7.4. Spectroradiometer302
  • 7.5. Goniophotometer305
  • 7.6. Spectrogoniometer307
  • 7.7. White light glossmeter309
  • Chapter 8 Modern Glossmeters315
  • 8.1. Imaging spectrometers317
  • 8.2. Gloss measurement by LED and photodiode318
  • 8.3. Gloss measurement by laser and photodiode324
  • 8.4. Gloss measurement by laser and photoarray325
  • 8.4.1. Gloss measurement from planar surface326
  • 8.4.2. Diffractive optical element (DOE) based glossmeter328
  • 8.4.2.1. Beam waist environment329
  • 8.4.2.2. Basis for DOE – hologram imagery334
  • 8.4.2.3. Wave optical treatment of DOE340
  • 8.4.2.4. DOE as sensor element of diffractive optical glossmeter (DOG)344
  • 8.4.2.5. Analysis of DOE image in gloss measurement354
  • 8.4.2.6. Gloss measurements at normal incidence357
  • 8.4.2.7. Miniaturization of DOG364
  • 8.4.2.8. Gloss of plastics367
  • 8.4.2.9. Gloss of metals377
  • 8.4.2.10. Gloss of ceramics388
  • 8.4.2.11. On-line measurement of gloss of print396
  • 8.4.2.12. Offbeat applications of DOG404
  • References413
  • Subject Index481
Book details
  • Vendor Elsevier S & T
  • SKU 9780080453149
  • ISBN-13 9780080554686
  • Author Silvennoinen, Raimo; Peiponen, Kai-Erik; Myller, Kari
  • Category Technology & Engineering
  • Subject Materials Science

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Description eBook delivery & access Reviews
The aesthetic appearance of various objects is important to human beings. One measure of the quality of an object is its surface quality, which can be characterized with the concept of gloss. Nowadays measurement of the gloss is a routine off-line method in assessment of quality of product at various sectors of industry.
The book gives a fresh treatment on the concept of gloss. Theoretical description will be on more general basis of optical physics than in other sources. The text will give a modern treatise of machine vision based glossmeters and furnish the ideas how to measure and analyse gloss from complex-structured objects. Innovations of machine vision and gloss data analysis by embedded micro-controllers and microprocessors are trademarks that fill the gaps of older textbooks.
Key Features:
- modern treatment of gloss
- presents novel glossmeter based high technology
- completes principle of machine vision
- application in industrial environment
- emphasis on pedagogical presentation

- modern treatment of gloss
- describes novel glossmeter-based high technology
- presents principles of machine vision
- gives applications in industrial environment
- emphasis on pedagogical presentation