Elsevier S & T

Thin Film Micro-Optics: New Frontiers of Spatio-Temporal Beam Shaping

Grunwald, Ruediger

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Table of contents
  • Front CoverCover
  • Thin Film Micro-Opticsiii
  • Copyright Pageiv
  • TABLE OF CONTENTSxi
  • PREFACEvii
  • ACKNOWLEDGEMENTSix
  • LIST OF ABBREVIATIONSxvii
  • Chapter 1 INTRODUCTION1
  • Chapter 2 MICRO-OPTICS3
  • 2.1. The concept of microoptics3
  • 2.2. Microoptics and macrooptics6
  • 2.2.1. Scaling laws for a size reduction6
  • 2.2.2. Diffraction and Fresnel number7
  • 2.3. Types of microoptical components9
  • 2.4. Refractive microoptics11
  • 2.4.1. Specific properties of refractive microoptical components11
  • 2.4.2. Gradient index lenses12
  • 2.4.3. Spherical surface relief lenses13
  • 2.4.4. Fresnel lenses17
  • 2.4.5. Fabrication of refractive components18
  • 2.5. Reflective microoptics19
  • 2.6. Diffractive microoptics21
  • 2.7. Hybrid microoptics23
  • 2.8. Replication and structure transfer25
  • 2.9. Specific properties of array structures26
  • 2.9.1. Types and general features of microoptical array structures26
  • 2.9.2. Fill factor, efficiency and symmetry27
  • 2.9.3. Spatial frequencies and Fresnel numbers29
  • 2.9.4. Cross-talk and self-imaging effects30
  • 2.9.5. Wavefront detection with array components32
  • 2.9.6. Gabor superlens34
  • 2.10. Stacked and planar microoptics35
  • 2.11. Problems and trends35
  • Chapter 3 THIN-FILM OPTICS39
  • 3.1. The concept of thin-film optics39
  • 3.2. Single transparent layer on substrates39
  • 3.2.1. Uniform Fabry-Perot etalon at monochromatic illumination40
  • 3.2.2. Fabry-Perot etalon of space-variant thickness at monochromatic illumination44
  • 3.2.3. Fabry-Perot etalon of space-variant thickness at polychromatic illumination45
  • 3.2.4. Transmission of ultrashort pulses through plane-parallel etalon structures47
  • 3.2.5. Quarter-wave layers and half-wave layers at monochromatic illumination48
  • 3.2.6. Admittance of absorbing layers at optical frequencies49
  • 3.3. Dielectric multilayer structures51
  • 3.3.1. The multilayer approach51
  • 3.3.2. Method of characteristic matrices51
  • 3.3.3. Dispersion management by layer stacks of adapted spectral phases53
  • 3.3.4. Diffraction management by layer stacks of spatially variable reflectance54
  • 3.4. Metal and metal-dielectric coatings56
  • 3.4.1. Single reflecting metal layers56
  • 3.4.2. Metal-dielectric layers as Gires-Tournois interferometer structures56
  • 3.5. Problems and trends57
  • Chapter 4 THIN-FILM MICROOPTICS59
  • 4.1. The concept of thin-film microoptics59
  • 4.2. Techniques for the fabrication of structured thin films: from macroscopic to microscopic scale60
  • 4.2.1. Subtractive and modifying techniques60
  • 4.2.2. Uniformity and nonuniformity of deposited layers61
  • 4.2.3. Separately rotating masks for structured light exposure and vapor deposition62
  • 4.2.4. Fixed thick shadow masks and extended sputtering sources63
  • 4.2.5. Fixed thin circular shadow masks rotating with the substrate64
  • 4.2.6. Thick shadow masks fixed at the substrates in a rotating system with point source64
  • 4.2.7. Deposition of arrays of microoptical components with miniaturized shadow masks65
  • 4.2.8. Simulation of the deposition through thick shadow masks fixed on a substrate in a system with67
  • 4.3. Specific properties of thin-film microoptical components71
  • 4.3.1. Specific advantages of thin-film deposition technique with shadow masks71
  • 4.3.2. Specific advantages of thin-film microoptical design71
  • 4.3.3. Thin-film microoptics on substrates: Specific properties and design constraints73
  • 4.3.4. Contact angle and maximum angle of incidence of thin-film microlenses78
  • 4.4. Types of thin-film microoptical components78
  • 4.5. Fabrication of thin-film microoptics with shadow masks80
  • 4.5.1. Vacuum deposition with planetary rotation and shadow masks80
  • 4.5.2. Types of shadow masks for the deposition of thin-film microstructures81
  • 4.5.3. Generation of arrays of high fill factors with the method of crossed deposition83
  • 4.5.4. Wire-grid masks85
  • 4.5.5. Deposition of nonspherical elements with slit and hole array masks of conical apertures88
  • 4.5.6. Generation of arrays of high fill factors and parabolic profiles with mesh-shaped masks93
  • 4.6. Pre-processing of polymer substrates for improving the adhesion of thin-film microoptics95
  • 4.7. Multilayer and compound microoptics98
  • 4.7.1. Multilayer microoptics98
  • 4.7.2. Metal-dielectric structures99
  • 4.8. Structure transfer of thin-film microoptical components by reactive ion etching103
  • 4.9. Nanolayer microoptics105
  • 4.10. VUV-capable transparent thin-film microoptics107
  • 4.11. Problems and trends109
  • Chapter 5 CHARACTERIZATION OF THIN-FILM MICROOPTICS111
  • 5.1. Specific measuring problems111
  • 5.2. Interferometric characterization of thin-film microlens arrays112
  • 5.2.1. Phase shift interferometer112
  • 5.2.2. Characterization of shape distribution and periodicity of microlens arrays113
  • 5.2.3. Optical functions of thin-film microlens arrays116
  • 5.3. Reflectance mapping of multilayer microoptics119
  • 5.3.1. Spatially resolved measurement of specular reflectance119
  • 5.3.2. Spatial reflectance mapping with angular resolution123
  • 5.4. Near field propagation measurements123
  • Chapter 6 SPATIAL BEAM SHAPING WITH THIN-FILM MICROOPTICS125
  • 6.1. Hybrid microoptics for improved efficiency of laser diode collimation125
  • 6.1.1. Motivation and basic concepts125
  • 6.1.2. Slow-axis collimation with compact systems of cylindrical microlenses128
  • 6.1.3. Angular-adapted micro-gradient AR coatings130
  • 6.2. Mode-selection in laser resonators133
  • 6.2.1. Stability management of compact solid-state laser resonators with micro-mirrors133
  • 6.2.2. Talbot resonators with micro-mirror arrays134
  • 6.2.3. Mode stabilization in laser diode MOPA-systems with external resonator for second harmonic ge137
  • 6.3. Generation of Bessel-like nondiffracting beams139
  • 6.3.1. Nondiffracting beams139
  • 6.3.2. Bessel-like beams141
  • 6.3.3. Generation of arrays of microscopic Bessel-like beams with thin-film axicons143
  • 6.3.4. Spatial self-reconstruction of Bessel-like beams146
  • 6.3.5. Self-apodized truncation of Bessel beams as a first way to shape needle beams147
  • 6.3.6. Ultraflat thin-film axicons of extremely small conical angles as a second way to generate nee152
  • 6.4. Shack-Hartmann wavefront sensing at extreme laser parameters with Bessel-like beams155
  • 6.4.1. Particular features of Shack-Hartmann sensors with Bessel-like nondiffracting beams155
  • 6.4.2. Transmissive and reflective setups with angular-tolerant thin-film microaxicons157
  • 6.5. VUV laser beam array generation and multichannel materials processing160
  • 6.5.1. VUV beam array generation with thin-film microoptics160
  • 6.5.2. Beam cleaning by absorption162
  • 6.5.3. VUV materials processing with thin-film microoptics163
  • Chapter 7 SPATIO-TEMPORAL BEAM SHAPING AND CHARACTERIZATION OF ULTRASHORT-PULSE LASERS167
  • 7.1. Motivation167
  • 7.2. Coherence mapping168
  • 7.2.1. Microoptical approaches based on multichannel interferometry168
  • 7.2.2. Coherence mapping with thin-film Fabry-Perot arrays171
  • 7.2.3. Coherence mapping with arrays of Bessel-like beams172
  • 7.2.4. Decoding of axial coherence information with arrays of Bessel-like beams176
  • 7.2.5. Coherence mapping with the Talbot effect176
  • 7.3. Spatio-temporal autocorrelation179
  • 7.3.1. Processing and characterization of ultrashort optical pulses179
  • 7.3.2. Concept of the collinear matrix autocorrelator based on arrays of Bessel-like beams180
  • 7.3.3. Transversal autocorrelation information in Bessel-like beams182
  • 7.3.4. Wavefront autocorrelation experiments183
  • 7.4. Hyperspectral sensing of polychromatic wavefronts188
  • 7.4.1. Prospects for a spatially-resolved spectral phase measurement188
  • 7.4.2. Hyperspectral Shack-Hartmann wavefront sensor with graxicon arrays190
  • 7.5. Generation of optical spatio-temporal X-pulses with thin-film structures193
  • 7.5.1. X-waves and X-pulses as spectral interference phenomena in spatio-temporal domain193
  • 7.5.2. Generation and direct detection of arrayed microscopic-size pulsed optical Bessel-like X-wave194
  • 7.6. Self-apodized truncation of ultrashort and ultrabroadband Bessel pulses196
  • 7.6.1. Spatial propagation of ultrashort-pulsed and ultrabroadband truncated Bessel-like beams gener197
  • 7.6.2. Spatio-spectral and spatio-temporal transfer of ultrashort-pulsed and ultrabroadband truncate199
  • 7.6.3. Comparison to ultrashort-pulsed Gaussian beams201
  • 7.7. Spatio-temporal self-reconstruction and nondiffracting images202
  • 7.7.1. Self-reconstruction and spatio-temporal information202
  • 7.7.2. Nondiffracting images203
  • Chapter 8 OUTLOOK205
  • REFERENCES207
  • FIGURE CREDITS253
  • GLOSSARY255
  • INDEX279
Book details
  • Vendor Elsevier S & T
  • SKU 9780444517463
  • ISBN-13 9780080471259
  • Author Grunwald, Ruediger
  • Category Science
  • Subject Acoustics & Sound

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"Thin-film microoptics" stands for novel types of microoptical components and systems which combine the well-known features of miniaturized optical elements with the specific advantages of thin optical layers. This approach enables for innovative solutions in shaping light fields in spatial, temporal and spectral domain. Low-dispersion and small-angle systems for tailoring and diagnosing laser pulses under extreme conditions as well as VUV-capable microoptics can be realized. Continuous-relief microstructures of refractive, reflective and hybrid characteristics are obtained by vapor deposition technologies with shadow masks in rotating systems. The book gives a comprehensive overview on fundamental laws of microoptics, types of thin-film microoptical components, methods and constraints of their design, fabrication and characterization, structure transfer into substrates, optical functions and applications. Recent theoretical and experimental results of basic and applied research are addressed. Particular emphasis will be laid on the generation of localized, nondiffracting few-cycle wavepackets of extended depth of focus and high tolerance against distortions. It is shown that the spectral interference of ultrabroadband conical beams results in spatio-temporal structures of characteristic X-shape, so-called X-waves, which are interesting for robust optical communication. New prospects are opened by exploiting small conical angles from nanolayer microoptics and self-apodized truncation of Bessel beams leading to the formation of single-maximum nondiffracting beams or "needle beams". Thin-film microoptical beam shapers have an enormous potential for future applications like the two-dimensional ultrafast optical processing, multichannel laser-matter interaction, nonlinear spectroscopy or advanced measuring techniques.

- Introduces a new and promising branch of microoptics
- Gives a compact overview on the types, properties and applications of the most important microoptical components containing valuable data and facts
- Helps to understand the basic optical laws
- Reports on the historical development line of thin-film microoptics
- Provides brand new results of research and development in the field of ultrashort-pulse laser beam shaping and diagnostics
- Discusses the future trends and first approaches of next generation microoptics
- Contains a carefully assorted glossary of the most important technical terms